Facilities and Equipments

Filtering by category is 'Microscope'
Total 5 records.

Atomic Force Microscopy

    • Organization: Khalifa University
    • Manufacturer: Asylum Research, https://www.asylumresearch.com/Products/MFP3DClassic/MFP3DClassic.shtml
    • Type: Equipments
    AFM is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning. More Details ...

    Cross-Section Polisher

      Cross-Section Polisher More Details ...

      Electron Probe Micro-Analyzer

        Electron Probe Micro-Analyzer More Details ...

        Field Emission “Auger” MicroProbe

          Field Emission “Auger” MicroProbe More Details ...

          Scanning Electron Microscope

            Scanning Electron Microscope More Details ...